Publication | Closed Access
Modeling of electronic stopping and damage accumulation during arsenic implantation in silicon
10
Citations
15
References
1995
Year
Arsenic ImplantationElectrical EngineeringIon ImplantationEngineeringPhysicsNanoelectronicsApplied PhysicsElectronic StoppingTime-dependent Dielectric BreakdownSemiconductor Device FabricationDamage AccumulationSilicon On InsulatorMicroelectronicsSilicon Debugging
| Year | Citations | |
|---|---|---|
Page 1
Page 1