X-ray study of the crystalline structure of CdTe layers grown on (001), (111)<i>A</i>, and (111)<i>B</i> CdTe surfaces by metalorganic chemical vapor deposition

Abstract

CdTe layers grown by metalorganic chemical vapor deposition on (111)A, (111)B, and (001) CdTe substrates exhibited substantial differences in crystalline microstructure. Double crystal diffractometry was used to resolve and identify the (111) microtwins. (111)B layers were found to be composed of lamella microtwins, while (111)A layers contained double positioning type twins and had a better structural quality. (001) layers exhibited the best crystalline quality and were found to be free of (111) twins.