Publication | Open Access
Non-exponential photoluminescence decay dynamics of localized carriers in disordered InGaN/GaN quantum wells: the role of localization length
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Citations
8
References
2006
Year
Luminescence IntensityWide-bandgap SemiconductorElectrical EngineeringLuminescence DynamicsEngineeringPhotoluminescencePhysicsApplied PhysicsCondensed Matter PhysicsLocalized CarriersAluminum Gallium NitrideGan Power DeviceLocalization LengthCategoryiii-v SemiconductorOptoelectronics
In this article, we report a combined experimental and theoretical study on the luminescence dynamics of localized carriers in disordered InGaN/GaN quantum wells. The luminescence intensity of localized carriers is found to exhibit an unusual non-exponential decay. Adopting a new model taking the radiative recombination and phonon-assisted hopping transition between different localized states into account, which was recently developed by Rubel et al., the non-exponential decay behavior of the carriers can be quantitatively interpreted. Combining with precise structure characterization, the theoretical simulations show that the localization length of localized carriers is a key parameter governing their luminescence decay dynamics.
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