Grain size and electrical resistivity measurements on aluminum polycrystalline thin films

<i>Numerical Recipes, The Art of Scientific Computing</i>

William H. Press, Brian P. Flannery, Saul A. Teukolsky et al. · American Journal of Physics · 1987 · 10K citations

Numerical Analysis, Computational Science, Numerical Computation +4

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W. H. Press, Brian P. Flannery, Saul A. Teukolsky et al. · Analytica Chimica Acta · 1987 · 3.2K citations

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Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

A. F. Mayadas, M. Shatzkes · Physical review. B, Solid state · 1970 · 2.1K citations

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C. R. Pichard, C. R. Tellier, A. J. Tosser · Thin Solid Films · 1979 · 81 citations

Materials Engineering, Materials Science, Engineering +7

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A. F. Mayadas, René Feder, R. Rosenberg · Journal of Vacuum Science and Technology · 1969 · 67 citations

Materials Science, Materials Engineering, High Temperature Materials +14