Measurement of the x-ray dose-dependent glass transition temperature of structured polymer films by x-ray diffraction

H. Keymeulen, Ana Díaz, Harun H. Solak, C. David, Franz Pfeiffer, B. D. Patterson, J. F. van der Veen, Mark P. Stoykovich, Paul F. Nealey

Journal of Applied Physics · 2007 · 18 citations · 37 references

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Abstract

The glass transition temperature (Tg) of polymer nanostructures was measured using a technique based on synchrotron x-ray diffraction from periodic grating structures. Poly(methyl methacrylate) (PMMA) nanostructures consisting of 1:1 lines:spaces with a 100 nm period and 100 nm height were characterized to have a Tg of 118 °C, which is comparable to the Tg of PMMA in bulk systems. The Tg of the PMMA structures also was measured as a function of absorbed x-ray dose. Doses ranging from 0 to 2400 mJ/mm3 were delivered to the PMMA structures prior to the Tg measurements; the Tg of the structures was found to decrease from 118 °C to 95 °C, respectively. The dose dependence of the PMMA glass transition temperature can be attributed to changes in the polymer molecular weight under exposure to x rays.

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