Journal of Crystal Growth · 2006 · 21 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationThin FilmsElectronic Material CharacterizationInorganic MaterialsOxide SemiconductorsPerovskite MaterialsThin Film Electrical PropertiesThin-film MaterialsBarium Titanate CeramicsElectrical PropertiesElectrical Properties AnalysisSemiconducting Oxide MaterialsThin Oxide FilmsThin Oxide LayersThin-film Oxides
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Oxygen pressure and thickness dependent lattice strain in La0.7Sr0.3MnO3 films
Joonghoe Dho, Nam Hwi Hur, I. S. Kim et al. · Journal of Applied Physics · 2003 · 110 citations