Journal of Applied Physics · 1999 · 240 citations · 15 references
EngineeringSilicon On InsulatorPhonon DispersionPhysical-meaning Weighting FunctionOptical PropertiesNanoscale ModelingSelective Uv RamanNanometrologyNanoscale ScienceMaterials SciencePhysicsNanotechnologySilicon NanocrystalsOne-phonon Confinement ModelNanocrystalline MaterialNanomaterialsApplied PhysicsPhononAccurate Size Determination
In this article, we show how the well-known one-phonon confinement model can be improved to determine the diameter of silicon nanocrystalline spheres from the optical phonon wave-number shift, even using a physical-meaning weighting function. We show that the fundamental parameter is the knowledge of the phonon dispersion. The accuracy of our approach is supported by experimental data obtained by selective UV Raman scattering on nanocrystalline silicon thin films produced by size-selected silicon cluster beam deposition.
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Raman shifts in Si nanocrystals
Jian Zi, H. Büscher, Claus Falter et al. · Applied Physics Letters · 1996 · 433 citations
Materials Science, Nanocrystalline Material, Engineering +12