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On the triggering mechanism for the metal–insulator transition in thin film VO2 devices: electric field versus thermal effects

Electrical EngineeringElectronic DevicesThin Film PhysicsEngineeringPhysicsNatural SciencesOxide ElectronicsSurface ScienceCondensed Matter PhysicsApplied PhysicsThin Film Process TechnologyThin FilmsMetal–insulator TransitionThin Film Processing