IEEE Transactions on Microwave Theory and Techniques · 2013 · 59 citations · 18 references
EngineeringRadio FrequencyMeasurementMicrowave TransmissionOptical TestingOptical MetrologyEducationSix-port Reflectometer ParametersButler MatrixReflection-coefficient MeasurementsElectromagnetic CompatibilityCalibrationTheoretical LimitsComplete AnalysisInstrumentationReflectanceAntennaOptical MeasurementAccuracy ImprovementMicrowave MeasurementMillimeter Wave TechnologyHigh-frequency Measurement
A complete analysis of the influence of six-port reflectometer parameters on the measurement accuracy is presented. A theoretical limit of the reflection-coefficient measurement has been investigated and is derived analytically. Moreover, for a set of six-ports reported in the literature, the numerical analysis of magnitude and phase measurement errors in a wide range of reflection-coefficient magnitude is presented. Furthermore, the modified six-port reflectometer utilizing a 4 × 4 Butler matrix and featuring scalable circle center distribution is proposed, and its advantage is discussed. The impact of power detectors uncertainty on an arbitrary six-port calibration procedure is presented. The performance of the proposed reflectometer has been verified in a wide frequency range of 2-3 GHz by measurements of a reflection coefficient having small magnitude. The obtained results are in agreement with the theoretical predictions, confirming the usefulness of the presented analysis.
18