X-ray photon correlation spectroscopy

Abstract

In recent years, X-ray photon correlation spectroscopy (XPCS) has emerged as one of the key probes of slow nanoscale fluctuations, applicable to a wide range of condensed matter and materials systems. This article briefly reviews the basic principles of XPCS as well as some of its recent applications, and discusses some novel approaches to XPCS analysis. It concludes with a discussion of the future impact of diffraction-limited storage rings on new types of XPCS experiments, pushing the temporal resolution to nanosecond and possibly even picosecond time scales.