IEEE Transactions on Instrumentation and Measurement · 1976 · 49 citations · 0 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSensorsDevice CharacterizationElectrical MeasurementLinear MeasurementNonlinear Circuit AnalysisPhotodetectorsSemiconductor DetectorsDetectorsDiode ModelingLoad ResistanceNonlinear Device CharacterizationPower InputRf DetectorsSmall-signal Equivalent Circuit Models
This paper describes two techniques for measuring the linearity of amplitude detectors in general, and for measuring the deviation from square-law E of point-contact diode detectors in particular. A general mathematical model is given for determining the RF input power as a function of the detector output voltage. It is shown how to choose the value and the temperature coefficient of the video load resistance to minimize E and make E independent of temperature.