Improved process control, lowered costs and reduced risks through the use of non-destructive mobility and sheet carrier density measurements on GaAs and GaN wafers - Concepedia

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Improved process control, lowered costs and reduced risks through the use of non-destructive mobility and sheet carrier density measurements on GaAs and GaN wafers

17

Citations

3

References

2004

Year

Kasey Hogan, Austin Blew, M. Cordes

Journal of Crystal Growth

Improved Process ControlElectrical EngineeringEngineeringGan WafersAluminum Gallium NitrideGan Power DeviceElectronic PackagingOptoelectronicsNon-destructive Mobility

References

	Year	Citations

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