Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (111)-oriented PLZT 10/40/60 thin films

Anthony Ferri, Sébastien Saitzek, Antonio Da Costa, Rachel Desfeux, G. Leclerc, R. Bouregba, G. Poullain

Surface Science · 2008 · 36 citations · 18 references

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