Publication | Closed Access
Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (111)-oriented PLZT 10/40/60 thin films
36
Citations
18
References
2008
Year
Materials ScienceThickness DependenceEngineeringMicrofabricationNanotechnologyPiezoelectric NanogeneratorsSurface ScienceApplied PhysicsScanning Force MicroscopyNanoscale Piezoelectric PropertiesPiezoelectricityPiezoelectric MaterialThin Films
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