Continuous-wave 155 μm diode-pumped surface emitting semiconductor laser for broadband multiplex spectroscopy

Abstract

A room-temperature-operating vertical external cavity surface emitting laser is applied around 1550 nm to intracavity laser absorption spectroscopy analyzed by time-resolved Fourier-transform interferometry. At an equivalent path length of 15 km, the high-resolution spectrum of the semiconductor disk laser emission covers 17 nm simultaneously. A noise-equivalent absorption coefficient at 1 s averaging equal to 1.5 x 10(-10) cm(-1)Hz(-1/2) per spectral element is reported for 65 km, the longest path length employed.