Publication | Closed Access
Characterization of the defect density and band tail of an a-Si:H i-layer for solar cells by improved CPM measurements
23
Citations
8
References
1994
Year
Electrical EngineeringEngineeringBand TailImproved Cpm MeasurementsApplied PhysicsSemiconductor MaterialSemiconductor Device FabricationDefect DensitySilicon On InsulatorPhotovoltaicsSemiconductor Device
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