A configurable angle-resolving detector system in STEM

The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy

J. N. Chapman, Philip E. Batson, Ewan Waddell et al. · Ultramicroscopy · 1978 · 216 citations

Natural Sciences, Materials Science, Physics +16

A single crystal of YAG-new fast scintillator in SEM

Rudolf Autrata, Petr Schauer, J Kuapil et al. · Journal of Physics E Scientific Instruments · 1978 · 153 citations

Natural Sciences, Materials Engineering, Materials Science +17

Performance of electron image converters with YAG single-crystal screen and CCD sensor

I. Daberkow, Karl‐Heinz Herrmann, Libin Liu et al. · Ultramicroscopy · 1991 · 104 citations

Engineering, Electrical Engineering, Materials Engineering +14

Performance of a low-noise CCD camera adapted to a transmission electron microscope

Stephan Kujawa, D. Krahl · Ultramicroscopy · 1992 · 61 citations

Engineering, Electrical Engineering, Digital Imaging +13