Publication | Closed Access
Texture evolution in Copper film at high temperature studied in situ by electron back-scatter diffraction
20
Citations
20
References
2005
Year
Materials ScienceSurface CharacterizationMaterial AnalysisEngineeringCopper FilmSurface AnalysisSurface ScienceApplied PhysicsElectron DiffractionElemental MetalHigh TemperatureTexture Evolution
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