Localized surface plasmon resonance anisotropy in template aligned silver nanoparticles: A case of biaxial metal optics

Abstract

Generalized ellipsometry is used to extract the dielectric functions of self-aligned silver nanoparticles on silicon ripple patterns which account for the anisotropic Localized Surface Plasmon Resonance shown by such nanostructures. The biaxial nature of dielectric functions shows its presence through the modified in-plane plasmonic behaviour as compared to the case of random nanoparticles. The nature of in-plane optical coupling and out of plane metallic behavior is further investigated by tuning the interparticle gap along the ripple direction and also varying the ripple periodicity. Thus, we propose that generalized ellipsometry may be used as an effective process monitoring technique to develop anisotropic plasmonic substrates with potential applications in photovoltaic systems as a plasmonic back reflector.