Unified model for QBD prediction for thin gate oxide MOS devices with constant voltage and current stress - Concepedia

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Unified model for QBD prediction for thin gate oxide MOS devices with constant voltage and current stress

23

Citations

16

References

2000

Year

Mohammed Tanvir Quddus, Thomas A. DeMassa, Julian J. Sanchez

Microelectronic Engineering

Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsBias Temperature InstabilityApplied PhysicsConstant VoltageMicroelectronicsQbd PredictionThin GateCircuit Simulation

References

	Year	Citations

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