Publication | Closed Access
Modelling of short-channel m.o.s. transistors
12
Citations
0
References
1970
Year
Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringPhysicsNanoelectronicsBias Temperature InstabilityApplied PhysicsShort-channel M.o.sCircuit SimulationBulk ChargeShort-channel M.o.s.t.sCharge Carrier TransportMicroelectronicsCharge TransportCircuit AnalysisCarrier VelocityElectrical Insulation
The effects of both the bulk charge due to the drain depletion region and the saturation of carrier velocity on the current/voltage characteristics of short-channel m.o.s.t.s are considered. Theoretical calculations based on both 2-dimensional and 1-dimensional models show close agreement with experimental measurements.