Solid-State Electronics · 1998 · 93 citations · 18 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsPower ElectronicsSemiconductor DevicesDislocations In SemiconductorsMaterial DegradationP-n JunctionsSemiconductor DefectsSemiconductor Device MaterialsSemiconductor ReliabilityBreakdown MechanismsDegradationDiode RectifiersDislocationsJunction RectificationScrew DislocationsSilicon Carbide (Sic) Materials
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<i>Encyclopedia of Applied Physics</i>
George L. Trigg, Steven J. Rothman, R. Benedek et al. · Physics Today · 1994 · 575 citations
Site-competition epitaxy for superior silicon carbide electronics
David Larkin, Philip G. Neudeck, J. A. Powell et al. · Applied Physics Letters · 1994 · 321 citations
Conductivity Anisotropy in Epitaxial 6H and 4H Sic
W. J. Schaffer, Gerry Negley, K. G. Irvine et al. · MRS Proceedings · 1994 · 289 citations