Absolute photoluminescence quantum efficiency measurement of light-emitting thin films

Abstract

We developed an integrated monochromatic excitation light source integrating sphere based detection system to accurately characterize the absolute photoluminescence quantum efficiency of commonly used polymer light emitting films without using a reference sample. Our methodology is similar to the method reported by de Mello et al. [Adv. Mater. 9, 230 (1997)] In this Note, we show that the absolute photoluminescence quantum efficiency might only be measured when an appropriate calibration of the spectral variation of the measurement system is done. This calibration is especially important when employing a short excitation wavelength (<400 nm) for common silicon-based detector.