Detector Characterization

Detector Characterization is a systematic analytical framework used to quantitatively assess and define the performance metrics, sensitivity, response time, noise properties, and spectral response of optical detectors under controlled conditions, enabling their evaluation and comparison within specific operational contexts.

1.1K

Publications

41K

Citations

8.1K

Authors

1.3K

Institutions

Publications per year

2017–2026

165

Authors

8.1K

  1. ET
    Evangelos Theocharous

    National Physical Laboratory, United Kingdom

    10 publications · 231 citations

    10

    h-index

  2. EI
    Erkki Ikonen

    National metrology institute VTT MIKES, Finland

    7 publications · 175 citations

    7

    h-index

  3. JR
    J. R. Smith

    Max Planck Institute for Gravitational Physics, Germany

    6 publications · 932 citations

    6

    h-index

  4. AG
    A. G. U. Perera

    Georgia State University, United States

    6 publications · 217 citations

    6

    h-index

  5. HG
    H. Grote

    Max Planck Institute for Gravitational Physics, Germany

    5 publications · 453 citations

    5

    h-index

1–5 of 8.1K

Venues

  1. 34

    h-index

  2. Applied Optics

    43 publications · 1.5K citations

    24

    h-index

  3. Applied Physics Letters

    33 publications · 1.3K citations

    23

    h-index

  4. IEEE Transactions on Nuclear Science

    49 publications · 1.7K citations

    23

    h-index

  5. 21

    h-index

1–5