Fabrication of submicron polysilicon lines by conventional techniques

K. H. Nicholas, H.E. Brockman, I. J. Stemp

Applied Physics Letters · 1975 · 10 citations · 1 references

Concepts

Abstract

A new method of making fine geometry polysilicon lines has been developed. It requires no special apparatus or critical processing. Silicon gate MOST’s with dimensions of about 1 μm have been fabricated. Applications of the fine geometry MOST’s to the fabrication of high−packing−density MOSIC’s and high−frequency transistors are outlined.

References

1