Focusing of Intense Ion Beams from Pinched-Beam Diodes

Shyke A. Goldstein, G. Cooperstein, Roswell Lee, D. Mosher, S. J. Stephanakis

Physical Review Letters · 1978 · 54 citations · 7 references

Concepts

Abstract

Geometric focusing of proton and deuteron beams extracted from pinched-beam diodes to current densities above 70 kA/${\mathrm{cm}}^{2}$ is demonstrated by a variety of experimental techniques. Time-dependent computer simulations of the electron and ion flow show good agreement with experiment.

References

7