Application of an iterative maximum-likelihood algorithm in PIXE depth profiling of trace elements

On the Convergence Properties of the EM Algorithm

Changbao Wu · The Annals of Statistics · 1983 · 3.3K citations · Full text

Computing, Computer Science, Algorithms +16

K- and L-shell ionization cross sections for protons and helium ions calculated in the ecpssr theory

David D. Cohen, M. Harrigan · Atomic Data and Nuclear Data Tables · 1985 · 232 citations

Natural Sciences, Physics, Nuclear Physics +6

Full-range solution for the measurement of thin-film surface densities with proton-excited x rays

F. William Reuter, Harold P. Smith · Journal of Applied Physics · 1972 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +15

Depth profile determination by ion-induced X-ray spectroscopy

W. Pabst · Nuclear Instruments and Methods · 1974 · 45 citations

Natural Sciences, Materials Science, Radiation Detection +11

Evaluation of depth profiling with PIXE

I. Brissaud, J.P. Frontier, Pierre Regnier · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 32 citations

Computing, Computer Science, Geoinformatics +10