Physical review. B, Condensed matter · 2000 · 52 citations · 26 references
Natural SciencesMaterials EngineeringMaterials ScienceMetallurgySurface EngineeringSurface ScienceElectron DiffractionEpitaxial GrowthLow-energy Electron DiffractionSurface CrystallographySurface MorphologySurface RoughnessCrystal Growth On SurfacesCrystal Surface MorphologyDiffraction Pattern AnalysisEpitaxial Growth MorphologyGrowth StudiesMolecular Beam EpitaxyRoughness EvolutionSurface Growth
Molecular beam epitaxy of Cu on Cu(001) at grazing angles of incidence has been studied using spot profile analysis low-energy electron diffraction. At angles of incidence larger than $50\ifmmode^\circ\else\textdegree\fi{}$ the evolving surface morphology no longer shows the fourfold symmetry inherent to Cu(001), leaving only the plane of incidence as a mirror plane. The surface roughness as well as the slope of the grown mound structures increase with increasing deposition angle. These findings are explained by steering, which originates from long-range attractive forces between incident atoms and substrate atoms and leads to preferential arrival of atoms on top of islands. Steering is of general importance and should routinely be considered in growth studies when the angle of incidence of the depositing beam is larger than $50\ifmmode^\circ\else\textdegree\fi{}.$
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Step Motion on Crystal Surfaces
Richard L. Schwoebel, Edward J. Shipsey · Journal of Applied Physics · 1966 · 1.6K citations