Crystallite Sizes and Carrier Mobilities in Evaporated Indium Antimonide Films

Abstract

The correlation between crystallite size and carrier mobility of indium antimonide films deposited in a vacuum on glass substrates was studied. The crystallite size was determined from the X-ray diffraction profile, while the carrier mobility was deduced from a d.c. measurement of the transverse magnetoresistance effect. The data obtained from 50 specimens revealed the existence of a threshold crystallite size for a high mobility film and that the threshold value of this dimension is of the same order of magnitude as the mean free path of the electrons, i.e. , 1000Å, Some effects of annealing the film on the crystallite size were also investigated.