Publication | Closed Access
Electrical characteristics due to differences in crystal damage induced by various implant conditions
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Citations
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References
2005
Year
Materials ScienceElectrical CharacteristicsElectrical EngineeringIon ImplantationEngineeringTime-dependent Dielectric BreakdownVarious Implant ConditionsCrystal DamageImplantable DeviceMicroelectronicsElectrical PropertiesElectrical PropertyElectrical Insulation
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