Applied Physics Letters · 1981 · 164 citations · 14 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesWide Band Gap SemiconductorsBand GapOhmic ContactsOhmic MaterialsSchottky Barrier ContactsSchottky BarriersSchottky ContactsSilicide ContactsSilicon
Some rare-earth elements, Tb, Er, Yb (including Y) and some of their respective silicides were found to make ohmic contacts to n-type silicon. Forward I/V and photoresponse measurements give values of about 0.7 eV for the Schottky-barrier height to p-type silicon. The sum of this value and of the experimentally estimated barrier height to n-type silicon, 0.4 eV, corresponds to the band gap of silicon.
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<i>The Crystal Chemistry and Physics of Metals and Alloys</i>
W. B. Pearson, D. Weaire · Physics Today · 1973 · 1.1K citations