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The Schottky-barrier height of the contacts between some rare-earth metals (and silicides) and <i>p</i>-type silicon
163
Citations
14
References
1981
Year
EngineeringN-type SiliconSilicon On InsulatorBand GapSemiconductor DeviceNanoelectronicsSchottky-barrier HeightMaterials ScienceElectrical EngineeringPhysicsSemiconductor MaterialSemiconductor Device FabricationMicroelectronicsRare-earth ElementsSurface ScienceApplied PhysicsCondensed Matter PhysicsOptoelectronicsRare-earth Metals
Some rare-earth elements, Tb, Er, Yb (including Y) and some of their respective silicides were found to make ohmic contacts to n-type silicon. Forward I/V and photoresponse measurements give values of about 0.7 eV for the Schottky-barrier height to p-type silicon. The sum of this value and of the experimentally estimated barrier height to n-type silicon, 0.4 eV, corresponds to the band gap of silicon.
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