Microscopy Research and Technique · 1992 · 13 citations · 20 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSolid State PhysicsSurface ScienceCrystallographyElectron MicroscopySurface CharacterizationSurface CrystallographySurface PhysicsTransmission Electron MicroscopyCrystal Surface MorphologyDiffraction Pattern AnalysisElectron Diffraction Of SurfacesLow-index PlanesSurface Plane CharacterizationSurface Structure Determination
Oxygen-annealed surfaces of sapphire with low Miller indices ((0001), [1010], [1120], [1011]) have been studied in both transmission electron microscopy (TEM) and reflection electron microscopy (REM) configurations. The significance of REM diffraction conditions for the determination of the nature of the step heights is discussed. The relationship between the TEM and REM images is explained. The structural features are those that might be expected from considerations of the atom arrangement in the low Miller index planes. The structural features on the surfaces varied with respect to annealing temperature and surface condition. Thermally stable structures that might appear from consideration of the equilibrium-annealing temperature are proposed.
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