Surface Plane Characterization
Surface Plane Characterization is a systematic method in crystallography that identifies and quantifies the orientation and geometric properties of a crystallographic plane within a lattice structure using Miller Indices as a standardized notation system.
20
Publications
862
Citations
76
Authors
38
Institutions
Publications per year
2017–2026
2
Parents
20
1–5 of 20
76
1
h-index
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h-index
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h-index
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h-index
1–5 of 76
38

Centre National de la Recherche Scientifique
Paris, France
4 h-index
13 publications
270 citations

Chinese Academy of Sciences
Beijing, China
2 h-index
8 publications
279 citations
University of Houston
Houston, United States
1 h-index
2 publications
138 citations

Universidad Autónoma de Madrid
Madrid, Spain
1 h-index
2 publications
22 citations

Harbin Institute of Technology
Harbin, China
1 h-index
4 publications
52 citations

National Institute of Advanced Industrial Science and Technology
Tsukuba, Japan
1 h-index
5 publications
190 citations
Shandong University
Jinan, China
1 h-index
6 publications
66 citations

Northeastern University
Shenyang, China
1 h-index
5 publications
75 citations
1–8 of 38
2 publications · 97 citations
2
h-index
2 publications · 63 citations
2
h-index
2 publications · 45 citations
2
h-index
1 publications · 11 citations
1
h-index
1 publications · 11 citations
1
h-index
1–5