Surface Plane Characterization

Surface Plane Characterization is a systematic method in crystallography that identifies and quantifies the orientation and geometric properties of a crystallographic plane within a lattice structure using Miller Indices as a standardized notation system.

20

Publications

862

Citations

76

Authors

38

Institutions

Publications per year

2017–2026

2

Authors

76

  1. AN
    Andrey N. Bordenyuk

    Wayne State University, United States

    1 publications · 25 citations

    1

    h-index

  2. HC
    H. C. Gatos

    Massachusetts Institute of Technology, United States

    1 publications · 242 citations

    1

    h-index

  3. KN
    Koichi Niihara

    The University of Osaka, Japan

    1 publications · 44 citations

    1

    h-index

  4. SR
    Selimar Rivera-Rubero

    University of Houston, United States

    1 publications · 69 citations

    1

    h-index

  5. TT
    Tadami Taoka

    Institute of Metal Research, China

    1 publications · 21 citations

    1

    h-index

1–5 of 76

Venues

  1. Acta Materialia

    2 publications · 97 citations

    2

    h-index

  2. Langmuir

    2 publications · 63 citations

    2

    h-index

  3. Surface Science

    2 publications · 45 citations

    2

    h-index

  4. Physica B Condensed Matter

    1 publications · 11 citations

    1

    h-index

  5. Journal of Crystal Growth

    1 publications · 11 citations

    1

    h-index

1–5