High-resolution electron microscope study of lamellar boundaries in Ti-rich TiAl polysynthetically twinned crystals - Concepedia

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High-resolution electron microscope study of lamellar boundaries in Ti-rich TiAl polysynthetically twinned crystals

76

Citations

14

References

1991

Year

H. Inui, A. Nakamura, Myung-Hoon Oh, M. Yamaguchi

Ultramicroscopy

Materials EngineeringMaterials ScienceMaterial AnalysisEngineeringElectron MicroscopyCrystal MaterialNanotechnologySurface ScienceApplied PhysicsMicroanalysisLamellar BoundariesTi-rich TialCrystallography

References

	Year	Citations

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