Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation - Concepedia

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Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation

69

Citations

15

References

1974

Year

S.S. Lau, Wei Chu, J. W. Mayer, K. N. Tu

Thin Solid Films

Materials ScienceX-ray CrystallographyMev 4HeX-ray SpectroscopyEngineeringSurface ScienceApplied PhysicsX-ray DiffractionSilicide FormationSynchrotron RadiationAngle X-ray DiffractionSynchrotron Radiation SourceMicrostructure

References

	Year	Citations

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