IEEE Transactions on Electron Devices · 1977 · 78 citations · 3 references
Natural SciencesElectrical EngineeringPhysicsElectrochemistryMicroelectronicsPlasma PhysicsCurrent DistributionCurrent-voltage CharacteristicsElectrical CharacterizationPlasma-surface InteractionsPlasma-wall InteractionsSurface ChargeCapacitanceCapacitance MeasurementCapacitance Measurement TechniquesCapacitance-voltage RelationsPlasma Display PanelsSemiconductor Device CharacterizationSurface Charge MeasurementSurface Charging
Real-time dynamic measurements are performed on a single cell in a standard commercially available large plasma panel. The measurements determine cell response to variations in address pulses, sustain waveforms, or priming from neighboring cells. The wall-charge measurement indicates the internal dielectric surface charge and the capacitance measurement indicates the existence of a plasma in the gas volume. These measurements have shown that neighboring on cells can cause a large wall-charge transfer in off cells that results in reduced write and sustain voltage margins. Direct wall-charge measurements allows use of a simple technique for determination of the voltage transfer curve of the plasma cell which greatly aids device characterization. The capacitance measurement has shown that a plasma exists in commercial MgO panels for 10-15 µs after the discharge-current peak. The capacitance and wall-charge measurements can be combined to give simultaneous real-time results.
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E. M. Guyer · Proceedings of the IRE · 1944 · 10 citations
Natural Sciences, Electrical Engineering, Materials Science +12