Applied Optics · 2000 · 70 citations · 6 references
EngineeringAerospace EngineeringInstrumentationMetrologyPhase TransformationsInterferometryOptical MetrologyInterferogram AnalysisInterferometric InstrumentationInterferometric MeasurementOptical InterferometersPhase MeasurementPhase Shifting Interferometry
As a phase shifter usually suffers from both translational and tilt-shift errors during shifting, so every pixel in the same interferogram will have a different phase-shift value. Thus nonlinear phase-measurement errors cannot be avoided, but even translational-shift error has been corrected effectively. However, based on the fact that the shifted phases of all the pixels in the same interferogram remain on the phase-shift plane, by defining this plane one can eliminate a significant number of phase errors. A new algorithm that is immune to both translational- and tilt-shift errors in a phase shifter for phase-stepping interferometers is presented. A first-order Taylor series expansion replaces the nonlinear equations for defining the phase-shift plane, and iteration of the algorithm guarantees its accuracy. Results of a computer simulation show that phase-measurement errors caused by both translation- and tilt-shift error can be compensated for completely, even when the tilt-shift error is not more than ?1%.
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Least-squares estimation in phase-measurement interferometry
C. J. Morgan · Optics Letters · 1982 · 213 citations