Science · 1994 · 191 citations · 22 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsInterface ScienceSolid State PhysicsAb Initio MethodsAtomic StructureCrystallographyDefect ModelingGrain Structure AnalysisStructure DeterminationBond Valence SumElectron Energy LossElectron Energy-loss SpectroscopyGrain Boundary CharacterizationGrain Boundary DefectsGrain Boundary ModelingGrain StructureHigh-resolution Imaging
An atomic structure model for a 25 degrees [001] symmetric tilt grain boundary in SrTiO(3) has been determined directly from experimental data with the use of high-resolution Z-contrast imaging coupled with electron energy loss spectroscopy. The derived model of the grain boundary was refined by bond-valence sum calculations and reveals candidate sites for dopant atoms in the boundary plane. These results show how the combined techniques can be used to deduce the atomic structure of defects and interfaces without recourse to preconceived structural models or image simulations.
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High-resolution Z-contrast imaging of crystals
Stephen J. Pennycook, D. E. Jesson · Ultramicroscopy · 1991 · 939 citations
A. V. Crewe, J.S. Wall, John P. Langmore · Science · 1970 · 751 citations
Natural Sciences, Chemistry, Physics +15