High resolution transmission electron microscopy study of interface structures and growth defects in epitaxial Bi<sub>2</sub>Sr<sub>2</sub>Ca<sub><i>n</i>−1</sub>Cu<sub><i>n</i></sub>O<sub>4+2<i>n</i> + δ</sub> films on SrTiO<sub>3</sub> and LaAlO<sub>3</sub>

N. D. Zakharov, D. Hesse, J. Auge, Hartmut G. Roskos, H. Kurz, Holger Hoffschulz, J. Dreβen, H. Stahl, G. Güntherodt

Journal of materials research/Pratt's guide to venture capital sources · 1996 · 12 citations · 19 references

Concepts

References

19