Improved Stability of CIGS-Based Thin-Film PV Modules

Abstract

The object of this study is to bring useful and effective data to establish the measurement procedures suitable to the CIGS-based thin-film PV technology. Stable performance in the outdoor exposure test is warranted if CIGS-based thin-film PV modules are prepared by employing the moduling (or packaging) technology for crystalline-Si PV modules. To verify our assumption that significantly reduced degradation or even no degradation may be observed by applying a light soaking during the Damp heat test, the modified Damp heat test (85degC temperature and 85 % relative humidity for 1000 hours) applying a continuous irradiation of 150 to 200 W/m <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> is performed. It is confirmed that this assumption is valid for the CIGS-based thin-film PV modules tested in the open-circuit condition due to the enhancement of FF