Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 2002 · 40 citations · 19 references
Natural SciencesMaterials EngineeringMaterials SciencePhase TransformationsSemiconductor MaterialsSolid State PhysicsDislocation MechanicsElectron MicroscopyMicrostructure AnalysisMicrostructure EvolutionSilicon MaterialsTransmission Electron MicroscopyAmorphizationDislocation PhysicsMicrostructurePhase Transformation AnalysisSiliconSilicon DefectsTransmission Electron Microscopy Of Dislocations
Abstract The microstructure beneath indents, with three different tip shapes (spherical, Vickers and Berkovich), in Si was examined using transmission electron microscopy. The focused-ion beam technique was applied to the preparation of specimens for cross-sectional observation. Activation of dislocations, cracking, phase transformation and amorphization were observed.
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Crystal data for high-pressure phases of silicon
Jing Hu, Larry D. Merkle, Carmen S. Menoni et al. · Physical review. B, Condensed matter · 1986 · 509 citations · Full text