<title>Multiplexed absolute strain measurements using extrinsic Fabry-Perot interferometers</title>

Abstract

Extrinsic Fabry-Perot interferometric (EFPI) sensors have previously been demonstrated for relative strain and temperature measurements for smart structure applications. Inherent difficulties in the signal processing of these devices has created the need for absolute measurement capabilities. In this paper, we present an absolute measurement technique based upon white-light interferometric path matching. The system matches a reference gap to the sensing gap of an EFPI. When the difference of these two lengths is within the coherence length of the source, an intensity envelope is created in the system output. Determination of the corresponding path mismatch indicates the size of the sensor gap and hence strain can be determined. This measurement technique is capable of multiplexing an array of EFPI sensors and data will be presented demonstrating four multiplexed devices. Theoretical considerations for system optimization are also presented.