Publication | Closed Access
Structural and XPS characterization of ALD Al2O3 coated porous silicon
322
Citations
33
References
2014
Year
Materials EngineeringMaterials ScienceAluminium NitrideEngineeringOxide ElectronicsSurface ScienceApplied PhysicsGallium OxideSemiconductor Device FabricationSilicon On InsulatorPorous Silicon
| Year | Citations | |
|---|---|---|
Page 1
Page 1