2007 · 61 citations · 2 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingFault-tolerant SystemsMicroelectronicsDefectsDevice ReliabilityHardware Fault ToleranceLogic SynthesisRedundancy TechniquesReliable System DesignDefect PredictionFault Tolerance In Integrated CircuitsFault-tolerant ArchitectureFault-tolerant Logic DesignFlip-flop DesignFlip-flopsRedundant Logic DesignYield Enhancement
Chip production yield of 70% can be increased to 91 % by using fine-grain redundant logic in which only the defective portion of the main circuit is switched to a redundant subcircuit block. In addition, defect-prediction flip-flops prevent over 80% of in-field failures caused by latent defects, while maintaining correct operation. All flip-flops are connected via a scan chain, which can be employed to reproduce states used in avoiding defects, and to trace defect points.
2
A self-tuning dvs processor using delay-error detection and correction
Shidhartha Das, Sanjay Pant, David Roberts et al. · 2005 · 78 citations
Engineering, Computer Engineering, Electrical Engineering +17