Publication | Closed Access
Reflectivity of HgSe and HgTe from 4 to 12 eV at 12 and 300°K
40
Citations
19
References
1964
Year
Materials ScienceReflectivity SpectrumIi-vi SemiconductorSpectroscopic PropertyEtched SamplesEngineeringPhysicsTransition Metal ChalcogenidesOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsCondensed Matter PhysicsQuantum MaterialsRadiative AbsorptionWater Surface ReflectanceSolid-state Physic4-12 Ev
The reflectivity of etched samples of HgSe and HgTe has been measured from 4-12 eV (3000-1050 \AA{}) at room and He temperatures. Several peaks found in the reflectivity spectrum have been assigned to interband transitions at the $L$ and $X$ points in the Brillouin zone. Doublets, which are due to the effect of spin-orbid interaction, are resolved when the samples are cooled to He temperature. The values for ${L}_{3}$ splitting (valence band) for both HgSe and HgTe are in agreement with other measurements of these materials in the visible region where a doublet due to ${L}_{3V}\ensuremath{-}{L}_{1C}$ transitions is found. Other transitions are also discussed.
| Year | Citations | |
|---|---|---|
Page 1
Page 1