Real-time picosecond electro-optic oscilloscope technique using a tunable semiconductor laser

Abstract

The feasibility of using a tunable semiconductor laser for real-time electro-optic measurements of picosecond electrical signals is demonstrated. The method is based on real-time amplitude modulation of a relatively long optical probe pulse, whose frequency is linearly swept (chirped) to provide temporal information. Such chirped optical probe pulses were obtained by fast tuning of the emission wavelength of a three-sectional distributed-Bragg-reflector diode laser. An electrical-pulse rise time of 18 ps was measured. Temporal-resolution limitations of this type of electro-optic oscilloscope are discussed.