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A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scale

Materials ScienceGrain BoundariesEngineeringPhysicsMicroscopyNatural SciencesSpectroscopySubnanometer ScaleCondensed Matter PhysicsApplied PhysicsElectron MicroscopyElectron SpectroscopyElectron MicroscopePlanar DefectsElectron DiffractionDefect Formation