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High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem

Materials ScienceMaterials EngineeringIi-vi SemiconductorTransition Metal ChalcogenidesEngineeringLayered MaterialNanotechnologySurface ScienceApplied PhysicsIon ScatteringHigh Resolution StudiesCross-section TemThin FilmsMolecular Beam Epitaxy