Control of polarization effects by internal antireflection

Abstract

Mouchart's theory of the buffer layer is reformulated in terms of internal antireflection and extended to general dielectric/metallic media. The all-dielectric case is then studied in oblique incidence as a means of depolarizing partial reflectors. Several procedures are indicated for the construction of buffering stacks which, when coupled with germinal stacks, balance out their p and s reflections at the given level. Examples of depolarized half-mirrors are presented. A novel version of the Argand diagram for thin films in oblique incidence is introduced during the analysis.