Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser

Stefan P. Hau‐Riege, Richard A. London, R. M. Bionta, Régina Soufli, D. D. Ryutov, M. D. Shirk, Sherry L. Baker, Patrick M. Smith, Pradeep Nataraj

Applied Physics Letters · 2008 · 13 citations · 12 references

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Abstract

Optical elements to be used for x-ray free electron lasers (XFELs) must withstand multiple high-fluence pulses. We have used an ultraviolet laser to study the damage of two candidate materials, crystalline Si and B4C-coated Si, emulating the temperature profile expected to occur in optics exposed to XFEL pulses. We found that the damage threshold for 105 pulses is ∼20% to 70% lower than the melting threshold.

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