Texture analysis of a muscovite-bearing quartzite: a comparison of some currently used techniques

A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

L. G. Schulz · Journal of Applied Physics · 1949 · 825 citations

Natural Sciences, Physics, Optics +15

Elements of x-ray crystallography

E. Parthé · Materials Science and Engineering · 1970 · 758 citations

Natural Sciences, Chemistry, Materials Science +12

Deformation Mechanisms, Rheology and Tectonics

Hans‐Rudolf Wenk · Journal of Structural Geology · 1991 · 720 citations

Natural Sciences, Earth Sciences, Geology +12

<i>Elements of X-ray Crystallography</i>

Leonid V. Azároff, Richard B. Zipin · Physics Today · 1969 · 666 citations

Natural Sciences, Materials Science, Physics +12

Electron channeling patterns in the scanning electron microscope

David C. Joy, Dale E. Newbury, D. L. Davidson · Journal of Applied Physics · 1982 · 353 citations

Natural Sciences, Materials Science, Physics +13